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Improved Spectrometer and a method to measure special characteristics of an object

Two aberrations or distortions are commonly found in the designs made by a conventional spectrometer lens. Hence there is a need to have an optical system in which both of these distortions are removed. This patent describes an improved spectrometer and a novel method to measure the spectral characteristics by using a single aberration-corrected lens or mirror system such that the light passes through or reflects component once.

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Based on patent titled Spectrometer and method for measuring the spectral characteristics thereof published By TestRight Nanosystems Pvt. Ltd

1 Introduction and key takeaways

<p><strong>Problem Statement:</strong></p> <p>Two aberrations or distortions are commonly found in the designs made by a conventional <a href="https://en.wikipedia.org/wiki/Spectrometer">spectrometer</a> lens. The first distortion is termed as <a href="https://www.researchgate.net/publication/8419603_Keystone_Aberration_Correction_in_Overhead_Projectors">chromatic keystone</a>- an effect that causes a line of each colour to differ in length depending on where the ray propagates concerning the centre of the lens.&nbsp;</p> <p>The second distortion is caused by the designs is the curvature of the slit, so that light of a single colour does not form a straight line, but is instead curved up (“smile”), or down (“frown”).</p> <p>These distortions arise at the dispersing element when the ray bundles exit the dispersing element at compound angles relative to the flat surface. Often, the amount of curvature may vary with wavelength. It would be of great advantage to provide an optical system in which both of these distortions are removed.</p> <p><strong>Solution:</strong></p> <p>The spectrometer using a single aberration-corrected lens or mirror system such that the light passes through or reflects on the component should be used to measure the spectral characteristics of an object&nbsp;</p> <p><em>This patent describes an improved spectrometer and a method for measuring the spectral characteristics of an object using the spectrometer.</em></p> <p><strong>Key takeaways</strong> of the patent:</p> <p>1. The<strong> spectrometer </strong>described in this patent is used to measure the optical characteristics like reflection, transmission, or absorption spectra of an object. Optical characteristics help in knowing the colour of items (fabric, paint, glass, etc), matching colours (in automobiles, interior decoration, etc).</p>

2 Illustrates the layout of the spectrometer

2

Light external source illuminates the object to help form an object generated input signal. The light source can be a laser, or plurality of wavelengths of energy like LED, etc. A slit 104 is used to reflect or transmit the light by the object.


4

A dispersion element 108 is used by the lens system to direct the input signal. The dispersion element disperses the input signal to form dispersed signals which are directed to the detector 110.

3

A lens system 106 is used as an input signal diverging onto a lens system after passing through the slit. The lens system typically includes different lenses that are made up of different materials. The lens system forms an aberration-corrected lens system.

1

Spectrometer is positioned at a sufficient distance from an object whose spectral characteristics are to be measured such that the light reaches the slit.

<p><strong>Fig 1 - Illustrates the layout of the spectrometer</strong></p> <p><strong>This spectrometer has a lens system that removes chromatic aberration that is caused when a normal lens is used.</strong> Also, this lens system is cost-effective in comparison to a lens used for covering the wide-angle of rays emerging through the slit.</p> <p><br></p>

3 Illustrates a block diagram of the spectrometer for measuring the spectral characteristics

5

The detector includes an amplitude detection unit 314 for detecting the amplitude or intensity of each selected diffracted wavelength signal and a processor 316 for receiving, processing and transmitting the spectral characteristics.


3

A dispersion element/ grating receives different wavelengths contained in the input signal. 

1

Spectral characteristics such as reflectivity, transmissivity, absorptivity, or emissivity of the object are measured when a light source 302 is passed from a slit 304 positioned for receiving the light reflected/transmitted/emitted by the object 

4

A detector detects each of the focused signals and generates an output signal correlative to the spectral characteristics of the object. 

2

An aberration-corrected optical system 306 has a number of optical elements used to receive the light signals from the slit. The optical elements are aligned in the aberration-corrected lens system such that the different wavelengths from the input signal are focused at one plane

<p><strong>Fig 3 - Block diagram of the spectrometer for measuring spectral characteristics of an object</strong></p> <p>Aberration for which corrections are done in the optical element include, defocus, astigmatism, tilt, spherical aberrations, coma, distortion, petzval field curvature, chromatic aberrations, etc., or a combination of these. Optical elements are integrated to perform one or more optical functions, like first collimating, second collimating, dispersing, first focusing, and second focusing.</p>

4 Understanding the claims

<p><em>*Note - Claims 1 is described in</em> <em><strong>Highlight 2</strong></em> <em>and</em> <em><strong>Highlight 3</strong></em></p> <p><strong>Independent claims</strong> of the patent:</p> <p><strong>Claim 1: </strong>An apparatus for measuring the spectral characteristics of an object, said apparatus comprising:</p> <p>a slit positioned for receiving light reflected, transmitted or emitted by said object and for diverging said light;</p> <p>an aberration-corrected optical system for receiving said diverging light signals from said slit, said aberration-corrected optical system including a plurality of optical elements, wherein said optical elements are aligned in said aberration-corrected lens system such that the different wavelengths contained in the input signal are focused at one plane,a dispersion element for receiving said different wavelengths contained in the input signal from said aberration-corrected optical system and dispersing said different wavelengths to form separately focused signals at one plane; and<br> <br> a detector means for detecting each of said focused signal;<br> <br> wherein said detector detects each of said focused signal and generates a corresponding output signal correlative to the spectral characteristics of the object.</p>

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